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 On the design of measuring circuit for OCVD method

Authors & Affiliations

Jiri Hajek and Vaclav Papez
Department of Electrotechnology
Faculty of Electrical Engineering
CTU in Prague
166 27 Prague 6
Czech Republic



The article deals with the matter that is often omitted by authors – design of measuring circuit. The most of publications describe theoretical background of the OCVD method or they interpret results obtained on modern SiC or 4H-SiC structures. But correct and relevant results are conditioned by corresponding measuring circuit. Even if the OCVD method is based “just” on recording of voltage response, measuring circuit must fulfill a lot of requirements from high-frequency techniques. Following article tries to explain these techniques.


OCVD, lifetime, transient effects, damping, inductance-less sensing.

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