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Fast Short Circuit Type I Detection Method based on VGE-Monitoring
Authors & Affiliations
C. Herrmann, X. Liu, J. Lutz and T. Basler,
Chair of Power Electronics, Chemnitz University of Technology, Chemnitz, Germany
DOI
https://doi.org/10.14311/ISPS.2021.018
Abstract
In this paper, a Short Circuit type I detection method based on the monitoring of the gate voltage is
investigated. The proposed detection principle relies on an existing method, which was realized as an
integrated solution before. A modified discrete circuit solution is introduced, developed and tested.
Moreover, measurements and investigations on different packaging concepts and test conditions are
performed. The overview of the functionality, reliability, and restraints of this method, as well as aspects
of a supposed dynamic self-adaption feature, are discussed.
Keywords:
IGBT, Short Circuit Detection, Gate Drive Unit